COMP 6521 – Sorting, Disk I/O & RAID (Exam Key Points)

Two-Phase Multiway Merge-Sort (2PMMS)

Phase 1: Run Generation

Phase 2: Multiway Merge

Exam: Be ready to compute I/O costs for given N,R,M,B and #passes.

Worked Example

Key: Understand how to derive fill counts, run counts, and total I/O time.

Optimizing Disk Access

Strategies

Exam: Be ready to explain why Phase 2 can’t be sped up by cylindrification, and compare scheduling vs striping.

Disk Reliability & RAID

Failure Detection

RAID Levels

Exam: Expect to compute recovery steps (XOR recompute), probability of failure, or identify recoverable crash pairs.

Likely Exam Topics

Mix of calculations (I/O time, passes, probabilities) and conceptual questions (why RAID 5 distributes parity, why mirror helps reads).